DocumentCode
3289563
Title
Producing phototransistors in a standard digital CMOS technology
Author
Sandage, Robert W. ; Connelly, J.Alvin
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
1
fYear
1996
fDate
12-15 May 1996
Firstpage
369
Abstract
Development of a standard CMOS fingerprint identification system has necessitated the search for a photodetector with the optimum performance of responsivity, crosstalk, dynamic range, and matching parameters. Pixel resolution is also important in order that fingerprint features on the order of 80 μm may be detected. This paper discusses six phototransistor configurations easily produced in CMOS technology and compares their experimental performance
Keywords
CMOS digital integrated circuits; crosstalk; fingerprint identification; integrated circuit technology; photodetectors; phototransistors; 80 micron; crosstalk; digital CMOS technology; dynamic range; fingerprint identification; matching parameters; photodetector; phototransistor; pixel resolution; responsivity; CMOS process; CMOS technology; Crosstalk; Dynamic range; Fingerprint recognition; Photoconductivity; Photodetectors; Photodiodes; Phototransistors; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-3073-0
Type
conf
DOI
10.1109/ISCAS.1996.539906
Filename
539906
Link To Document