• DocumentCode
    3290297
  • Title

    Modeling lidar scene sparsity using compressive sensing

  • Author

    Castorena, Juan ; Creusere, Charles D. ; Voelz, David

  • Author_Institution
    Klipsch Sch. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    2186
  • Lastpage
    2189
  • Abstract
    One of the major problems associated with LIDAR sensing is that significant amounts of data must be collected to obtain detailed topographical information about a region. Current efforts to solve this problem have focused on designing compression algorithms which operate on the collected data. These, however, require the collection of large amounts of data only to discard most of it in some transformed domain. Instead, compressive sensing has demonstrated that highly accurate signal reconstructions are achievable even when sampling below the Nyquist rate. Such sensing is clearly desirable for LIDAR range data compression if it can be achieved. One notes, however, that compressive sensing requires a priori knowledge of the sparsifying basis of the signal which is a major problem for LIDAR since that basis depends not only on the underlying scene complexity but also on the laser spot size and target distance. For these reasons, the goal of this research is to take the first steps in establishing a relationship between typical LIDAR scenes of varying complexity and the sparsity of the scene compressively sampled.
  • Keywords
    data compression; image reconstruction; optical radar; radar imaging; LIDAR range data compression; LIDAR scene sparsity modeling; Nyquist rate; compressive sensing; scene complexity; signal reconstruction; Complexity theory; Compressed sensing; Laser radar; Optical surface waves; Rough surfaces; Surface reconstruction; Surface roughness; Compressive sensing; LIDAR; scene complexity; sparsity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5649010
  • Filename
    5649010