• DocumentCode
    3291079
  • Title

    Proposal of surface topography observer considering Z-scanner for high-speed AFM

  • Author

    Shiraishi, T. ; Fujimoto, H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama, Japan
  • fYear
    2010
  • fDate
    June 30 2010-July 2 2010
  • Firstpage
    2754
  • Lastpage
    2759
  • Abstract
    The purpose of this paper is implementation of fast imaging of AFM. In general AFM, the image is obtained from the control input of the Z-scanner. In this case, Fast imaging is prevented by the resonance peak of the plant. In authors´ research group, the surface topography observer which is the surface topography estimating method based on the observer theory has been proposed. In this paper, the dynamic model used by authors´ research group is improved, and the more detailed model is proposed. Therefore, the surface topography observer still faster than the conventional surface topography observer is proposed. Simulation and an experimental result show the effectiveness of the proposed method.
  • Keywords
    atomic force microscopy; observers; physical instrumentation control; surface topography; Z-scanner; high speed AFM; observer theory; surface topography observer; Atomic force microscopy; Atomic measurements; Control systems; Force measurement; Nanobioscience; Proposals; Resonance; Surface topography; Three-term control; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2010
  • Conference_Location
    Baltimore, MD
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-7426-4
  • Type

    conf

  • DOI
    10.1109/ACC.2010.5531399
  • Filename
    5531399