DocumentCode
3291079
Title
Proposal of surface topography observer considering Z-scanner for high-speed AFM
Author
Shiraishi, T. ; Fujimoto, H.
Author_Institution
Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama, Japan
fYear
2010
fDate
June 30 2010-July 2 2010
Firstpage
2754
Lastpage
2759
Abstract
The purpose of this paper is implementation of fast imaging of AFM. In general AFM, the image is obtained from the control input of the Z-scanner. In this case, Fast imaging is prevented by the resonance peak of the plant. In authors´ research group, the surface topography observer which is the surface topography estimating method based on the observer theory has been proposed. In this paper, the dynamic model used by authors´ research group is improved, and the more detailed model is proposed. Therefore, the surface topography observer still faster than the conventional surface topography observer is proposed. Simulation and an experimental result show the effectiveness of the proposed method.
Keywords
atomic force microscopy; observers; physical instrumentation control; surface topography; Z-scanner; high speed AFM; observer theory; surface topography observer; Atomic force microscopy; Atomic measurements; Control systems; Force measurement; Nanobioscience; Proposals; Resonance; Surface topography; Three-term control; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2010
Conference_Location
Baltimore, MD
ISSN
0743-1619
Print_ISBN
978-1-4244-7426-4
Type
conf
DOI
10.1109/ACC.2010.5531399
Filename
5531399
Link To Document