• DocumentCode
    3292199
  • Title

    Actuator fault detection and diagnosis based on morphology-wavelet

  • Author

    Zhang, Yi ; Hou, Guolian ; Wu, Baojiang

  • Author_Institution
    Coll. of light Ind., Hebei Polytech. Univ., Tangshan, China
  • fYear
    2009
  • fDate
    15-18 Dec. 2009
  • Firstpage
    4902
  • Lastpage
    4907
  • Abstract
    The paper described a novel method for detecting and identifying faults that occur in the actuator of control systems with input and output signals related to the component itself. The diagnosis algorithm consists of three steps: firstly, generalized morphological filter with multi-structure elements is designed to filter the random noise and impulse noise in actuator´s input and output signals. And secondly, wavelet transform, which has been proposed for sensor´s fault diagnosis some years ago, is developed for actuator´s fault diagnosis. To effectively extract the abruptly fault characteristic, wavelet transform was used to analyze the filtered signals in this paper. By the Multi Resolution Analyzing (MRA), the faults can be detected accurately. Thirdly, according to calculating the Lipschitz Exponent (LE) at the fault´s point, the fault type can be identified. The several typical faults such as fix, gain, bias have been studied. The effectiveness of the proposed approach is demonstrated by the means of experimental results and simulations.
  • Keywords
    actuators; control systems; fault diagnosis; mathematical morphology; wavelet transforms; Lipschitz exponent; actuator fault detection; actuator fault diagnosis; control systems; morphology-wavelet; multi resolution analyzing; Actuators; Algorithm design and analysis; Control systems; Fault detection; Fault diagnosis; Filters; Multiresolution analysis; Signal design; Signal processing; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
  • Conference_Location
    Shanghai
  • ISSN
    0191-2216
  • Print_ISBN
    978-1-4244-3871-6
  • Electronic_ISBN
    0191-2216
  • Type

    conf

  • DOI
    10.1109/CDC.2009.5399470
  • Filename
    5399470