• DocumentCode
    3294765
  • Title

    A Technique for Co Target Discharge Stabilization Using an Ion Gauge in the Sputtering System

  • Author

    Muraoka, Tatsuo ; Kobayashi, Kazunori

  • Author_Institution
    Fujitsu Ltd., Aizuwakamatsu
  • fYear
    2006
  • fDate
    25-27 Sept. 2006
  • Firstpage
    385
  • Lastpage
    386
  • Abstract
    Cobalt sputtering has a disadvantage in the lost operation time resulting from unstable discharge when cobalt is deposited on the shield. We successfully achieved stable discharge by utilizing an ion gauge instead of an igniter, even during sputtering, to supply thermal electrons to the discharge space. This technique doubles productivity.
  • Keywords
    cobalt; sputtering; Co; ion gauge; sputtering system; target discharge stabilization; thermal electrons; Cities and towns; Cobalt; Electrons; Fault location; Manufacturing processes; Pressure measurement; Productivity; Semiconductor device manufacture; Sputtering; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
  • Conference_Location
    Tokyo
  • ISSN
    1523-553X
  • Print_ISBN
    978-4-9904138-0-4
  • Type

    conf

  • DOI
    10.1109/ISSM.2006.4493114
  • Filename
    4493114