• DocumentCode
    3296669
  • Title

    Parametric model order reduction accelerated by subspace recycling

  • Author

    Feng, Lihong ; Benner, Peter ; Korvink, Jan G.

  • Author_Institution
    Dept. of Microsyst. Eng. (IMTEK), Univ. of Freiburg, Freiburg, Germany
  • fYear
    2009
  • fDate
    15-18 Dec. 2009
  • Firstpage
    4328
  • Lastpage
    4333
  • Abstract
    Many model order reduction methods for parameterized systems need to construct a projection matrix V which requires computing several moment matrices of the parameterized systems. For computing each moment matrix, the solution of a linear system with multiple right-hand sides is required. Furthermore, the number of linear systems increases with both the number of moment matrices used and the number of parameters in the system. Usually, a considerable number of linear systems has to be solved when the system includes more than two parameters. The standard way of solving these linear systems in case sparse direct solvers are not feasible is to use conventional iterative methods such as GMRES or CG. In this paper, a fast recycling algorithm is applied to solve the whole sequence of linear systems and is shown to be much more efficient than the standard iterative solver GMRES as well as the newly proposed recycling method MKR-GMRES from. As a result, the computation of the reduced-order model can be significantly accelerated.
  • Keywords
    iterative methods; linear systems; reduced order systems; MKR-GMRES; iterative methods; linear system; moment matrices; parameterized systems; parametric model order reduction method; projection matrix; recycling algorithm; reduced order model; sparse direct solvers; subspace recycling; Acceleration; Character generation; Chemical technology; Equations; Iterative algorithms; Iterative methods; Linear systems; Parametric statistics; Recycling; Reduced order systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
  • Conference_Location
    Shanghai
  • ISSN
    0191-2216
  • Print_ISBN
    978-1-4244-3871-6
  • Electronic_ISBN
    0191-2216
  • Type

    conf

  • DOI
    10.1109/CDC.2009.5399717
  • Filename
    5399717