• DocumentCode
    3299524
  • Title

    2.5 GHz pin electronics SiGe driver for IC test equipment

  • Author

    Goren, David ; Zelikson, Michael ; Leibowitz, Moshe ; Szenher, Frank

  • Author_Institution
    Res. Lab., IBM Corp., Haifa, Israel
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    31
  • Lastpage
    33
  • Abstract
    The design and characterization of a 2.5 GHz pin electronic SiGe driver is reported. Measured performance includes: programmable output swing from 100 mV to 1.7 V into 25 Ω trise/tfall of 60 ps at full swing, propagation delay dispersion of 20 ps
  • Keywords
    Ge-Si alloys; UHF integrated circuits; UHF measurement; bipolar analogue integrated circuits; driver circuits; high-speed integrated circuits; integrated circuit testing; semiconductor materials; test equipment; 100 mV to 1.7 V; 2.5 GHz; IC test equipment; SiGe; SiGe driver; adaptive overshoot control; characterization; pin electronics driver; programmable output swing; Adaptive control; Current control; Driver circuits; Electronic equipment testing; Germanium silicon alloys; Programmable control; Propagation delay; Silicon germanium; Test equipment; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 1999. Proceedings of the 1999
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1088-5714-0
  • Print_ISBN
    0-7803-5712-4
  • Type

    conf

  • DOI
    10.1109/BIPOL.1999.803519
  • Filename
    803519
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3299524