• DocumentCode
    3303451
  • Title

    Hybrid Boltzmann transport-Schrodinger equation model for quantum well injection transit (QWITT) diodes

  • Author

    Gullapalli, K.K. ; Miller, D.R. ; Neikirk, D.P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • fYear
    1991
  • fDate
    8-11 Dec. 1991
  • Firstpage
    511
  • Lastpage
    514
  • Abstract
    The authors report a self-consistent study of steady-state nonstationary transport in QWITT diodes using the pure state tunneling theory to treat transport through the double barrier quantum well region and the Boltzmann transport equation (BTE) to treat transport in the rest of the device. The distribution functions at the boundaries of the double barrier structure are evaluated, taking into account both tunneling and phonon scattering processes. It si found that velocity overshoot occurs in a region of 50 nm within the double barrier region, with a peak velocity of about 8*10/sup 7/ cm/sec occurring immediately after injection. The velocity falls rapidly to 7-8*10/sup 6/ cm/sec over a distance of 50 nm. Due to the high energy of carriers injected from the quantum well and the presence of high electric fields, the extent of the velocity overshoot in the drift region of QWITT diodes is limited.<>
  • Keywords
    Boltzmann equation; Schrodinger equation; high field effects; semiconductor device models; semiconductor diodes; solid-state microwave devices; transit time devices; tunnelling; Boltzmann transport equation; Boltzmann transport-Schrodinger equation; QWITT diodes; double barrier structure; drift region; high electric fields; hybrid model; phonon scattering; pure state tunneling theory; quantum well injection transit; steady-state nonstationary transport; velocity overshoot; Boltzmann equation; Electron devices; Frequency; Microelectronics; Microwave devices; Quantum computing; Quantum mechanics; Resonant tunneling devices; Semiconductor diodes; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0243-5
  • Type

    conf

  • DOI
    10.1109/IEDM.1991.235344
  • Filename
    235344