Quantized Conductance Of A Gate-All-Around Silicon Quantum Wire Transistor

Author

Je, Minkyu ; Han, Sangyeon ; Kim, IIgweon ; Shin, Hyungcheol

Author_Institution

KAIST

fYear

1998

fDate

13-16 July 1998

Firstpage

150

Lastpage

151

Keywords

Electrons; Etching; Fabrication; Lithography; MOSFETs; Numerical analysis; Silicon; Temperature; Voltage; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Microprocesses and Nanotechnology Conference, 1998 International

Conference_Location

Kyoungju, South Korea

Print_ISBN

4-930813-83-2

Type

DOI

10.1109/IMNC.1998.730018

Filename

730018

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