FEM analysis of MMIC microstrip structures up to 40GHz for studying effects of dispersion and physical dimensions on effective dielectric constant and characteristic impedance behaviour

Author

Thakur, J.P. ; Pandey, A.K. ; Gupta, K.K. ; Vyas, H.P.

Author_Institution

Solid State Phys. Lab., Delhi, India

fYear

2002

fDate

17-19 Aug. 2002

Firstpage

856

Lastpage

859

Abstract

This paper presents a behavioural study of the microstrip´s electrical parameters viz. effective dielectric constant (ε_eff) and characteristic impedance (Z_o) in a multi-layered dielectric medium (MMIC) on a GaAs substrate with a conducting strip of finite thickness. The effects of variation of microstrip width, substrate height and frequency on ε_eff and Z_o have been evaluated up to 40 GHz with the help of a High Frequency Structure Simulator (HFSS) which employs Finite Element Method for solving electromagnetic fields associated with 3D MMIC structures.

Keywords

MMIC; finite element analysis; microstrip lines; permittivity; 3D MMIC microstrip structure; 40 GHz; GaAs; GaAs substrate; High Frequency Structure Simulator; characteristic impedance; dispersion characteristics; effective dielectric constant; electrical parameters; electromagnetic field; finite element method; multilayered dielectric medium; Dielectric constant; Dielectric substrates; Dispersion; Finite element methods; Frequency; Gallium arsenide; Impedance; MMICs; Microstrip; Strips;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on

Print_ISBN

0-7803-7486-X

Type

conf

DOI

10.1109/ICMMT.2002.1187836

Filename

1187836