Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier

Author

Beurze, R.H. ; Xing, Y. ; van Kleef, R. ; Tangelder, R.J.W.T. ; Engin, N.

Author_Institution

Twente Univ., Enschede, Netherlands

fYear

1999

fDate

25-28 May 1999

Firstpage

28

Lastpage

33

Abstract

This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage.

Keywords

BiCMOS analogue integrated circuits; audio-frequency amplifiers; automatic testing; built-in self test; design for testability; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; power amplifiers; production testing; BiCMOS/DMOS process; DOTSS software tool; PWM amplifier; behavioral modeling; defect-oriented test simulation system; defect-oriented testing; design-for-testability; deterministic fault extraction; fault simulations; high fault coverage; industrial test development; mixed-signal class-D amplifier; practical implementation; underlying fault mechanisms; Circuit faults; Circuit testing; High power amplifiers; Integrated circuit testing; Niobium; Power amplifiers; Power generation; Pulse amplifiers; Semiconductor device testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

European Test Workshop 1999. Proceedings

Conference_Location

Constance, Germany

Print_ISBN

0-7695-0390-X

Type

conf

DOI

10.1109/ETW.1999.804205

Filename

804205