DocumentCode
3310969
Title
The Procedure of Half-Wave Number Measurement at Resonant Frequencies
Author
Chukhov, V.V.
Author_Institution
Zhytomyr State Technol. Univ., Zhytomyr
Volume
2
fYear
2007
fDate
25-30 June 2007
Firstpage
836
Lastpage
838
Abstract
Waveguides methods of dielectric permeability measurement are widely used for their simplicity. Typical measurement cell in these methods is waveguide segment with flat dielectric layer (specimen). If dielectric without loss, VSWR (voltage standing wave ratio) frequency response for this cell has periodic, low damping character. Frequencies of VSWR minimum are resonant frequencies and frequencies of VSWR maximum are antiresonant frequencies. It gives possibility to produce method of dielectric permeability measurement, which uses means resonant or antiresonant frequencies only.
Keywords
dielectric losses; dielectric measurement; dielectric thin films; dielectric waveguides; frequency response; permeability; dielectric permeability measurement; flat dielectric layer; frequency response; half-wave number measurement; resonant frequency; voltage standing wave ratio; waveguide methods; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Frequency response; Length measurement; Permeability measurement; Resonance; Resonant frequency; Waveguide components;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves and Workshop on Terahertz Technologies, 2007. MSMW '07. The Sixth International Kharkov Symposium on
Conference_Location
Kharkov
Print_ISBN
1-4244-1237-4
Type
conf
DOI
10.1109/MSMW.2007.4294831
Filename
4294831
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