• DocumentCode
    3310969
  • Title

    The Procedure of Half-Wave Number Measurement at Resonant Frequencies

  • Author

    Chukhov, V.V.

  • Author_Institution
    Zhytomyr State Technol. Univ., Zhytomyr
  • Volume
    2
  • fYear
    2007
  • fDate
    25-30 June 2007
  • Firstpage
    836
  • Lastpage
    838
  • Abstract
    Waveguides methods of dielectric permeability measurement are widely used for their simplicity. Typical measurement cell in these methods is waveguide segment with flat dielectric layer (specimen). If dielectric without loss, VSWR (voltage standing wave ratio) frequency response for this cell has periodic, low damping character. Frequencies of VSWR minimum are resonant frequencies and frequencies of VSWR maximum are antiresonant frequencies. It gives possibility to produce method of dielectric permeability measurement, which uses means resonant or antiresonant frequencies only.
  • Keywords
    dielectric losses; dielectric measurement; dielectric thin films; dielectric waveguides; frequency response; permeability; dielectric permeability measurement; flat dielectric layer; frequency response; half-wave number measurement; resonant frequency; voltage standing wave ratio; waveguide methods; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Frequency response; Length measurement; Permeability measurement; Resonance; Resonant frequency; Waveguide components;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves and Workshop on Terahertz Technologies, 2007. MSMW '07. The Sixth International Kharkov Symposium on
  • Conference_Location
    Kharkov
  • Print_ISBN
    1-4244-1237-4
  • Type

    conf

  • DOI
    10.1109/MSMW.2007.4294831
  • Filename
    4294831