• DocumentCode
    3312206
  • Title

    Computer modeling of local-overall interactive buckling on cut-T struts

  • Author

    Peng Xiaotong ; Chen Lin

  • Author_Institution
    Sch. of Civil & Archit. Eng., Univ. of Jinan, Jinan, China
  • fYear
    2009
  • fDate
    8-11 Aug. 2009
  • Firstpage
    117
  • Lastpage
    121
  • Abstract
    In order to study the interactive action of local and overall buckling, a test program of cut-t struts was performed. Based on that, a nonlinear finite element model for interaction between local and overall buckling on singly symmetric section is made by using the general finite element software ANSYS. In the model, factors such as initial imperfections, geometric and material nonlinearity are considered. By comparison of theoretical results, experimental and calculated results using different element type, it was shown that the phenomenon of interactive buckling is evident. The distortional buckling and local buckling should be taken into account when overall buckling is under analysis. These three buckling are not suitable to study separately. The thin-walled struts, which were designed under the principle of equal-stability, are sensitive to the initial imperfection. Some conclusions, which are useful for construction design, are also introduced.
  • Keywords
    buckling; construction components; design engineering; distortion; finite element analysis; structural engineering computing; thin wall structures; ANSYS FEM software; computer modeling; construction design; cut-T struts; distortional buckling; local-overall interactive buckling; nonlinear finite element model; thin-walled struts; Design engineering; Electronic mail; Finite element methods; Geometry; Performance evaluation; Solid modeling; Stress; Testing; Thin wall structures; Welding; computer modeling; experiment; finite element; interactive buckling; simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4519-6
  • Electronic_ISBN
    978-1-4244-4520-2
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2009.5234585
  • Filename
    5234585