• DocumentCode
    3313085
  • Title

    Error analysis of spectral reflectance derived from imaging spectrometer data

  • Author

    Kerekes, John P.

  • Author_Institution
    Lincoln Lab., MIT, Cambridge, MA, USA
  • Volume
    5
  • fYear
    1998
  • fDate
    6-10 Jul 1998
  • Firstpage
    2697
  • Abstract
    As the field of remote imaging spectrometry grows, interest increases in applications that require the data be “corrected” to surface reflectance. However, the utility of the data for these applications will be limited by the accuracy to which the correction can be performed. Two approaches to atmospheric compensation are reviewed and applied to airborne spectrometer data to study their error characteristics. An end-to-end analysis model is used to extend the study to examine the effects of individual sources of error. Results indicate that random errors of 1 to 2% reflectance units and bias errors of 1 to 4% are achievable in atmospheric window regions, with considerably higher errors in atmospheric absorption bands
  • Keywords
    atmospheric optics; geophysical techniques; remote sensing; terrain mapping; atmospheric compensation; atmospheric correction; end-to-end analysis model; error; error analysis; geophysical measurement technique; hyperspectral imaging; land surface; multispectral remote sensing; optical imaging; optics; spectral reflectance; surface reflectance; terrain mapping; Absorption; Atmospheric modeling; Error analysis; Error correction; Layout; Lighting; Reflectivity; Scattering; Sensor phenomena and characterization; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium Proceedings, 1998. IGARSS '98. 1998 IEEE International
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-4403-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.1998.702323
  • Filename
    702323