A March-Based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories

In this paper, we propose a multiphase March-like algorithm for partial and full diagnosis of all simple static faults in static random access memories, as well as location of the position of the failed bit. In phase 1, a march-like algorithm of complexity 2N is proposed for partial diagnosis to differentiate between single-cell and two-cell faults. In phase 2, for two-cell faults, we propose a march-like algorithm of complexity 41N for location of the position of the failed bit. In Phase 3, we used a march-like algorithm of a constant complexity for full diagnosis of all simple static faults.