• DocumentCode
    3317199
  • Title

    Robust Eye Localization on Multi-View Face in Complex Background Based on SVM Algorithm

  • Author

    Fu You-jia ; Li Jian-wei ; Xiang Ru-xi

  • Author_Institution
    Key Lab. of Opto-Electron. Technol. & Syst. of the Minist. of Educ., Chongqing Univ., Chongqing, China
  • fYear
    2010
  • fDate
    23-25 July 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Focused on multi-view eye localization in complex background, a new detection method based improved SVM is proposed. First, the face is located by AdaBoost detector and the eye searching range on the face is determined. Then, the crossing detection method, which uses the feature of eye and brow integrated as a whole, and the improved SVM detectors trained by large scale multi-view eye examples are adopted to find the candidate eye regions. Based on the fact that the window region with higher weight in SVM classifier is relatively closer to the eye, and the same eye tends to be repeatedly detected by near windows, the candidate eye regions are filtered to refine the eye location on the multi-view face. Experiments show that the method has very good accuracy and robustness to the eye localization with various face post and expression in the complex background.
  • Keywords
    eye; face recognition; feature extraction; object detection; support vector machines; AdaBoost detector; SVM classifier; SVM detector; complex background; crossing detection method; eye localization; eye location; eye searching range; multi-view face; Artificial neural networks; Detectors; Eyes; Face detection; Face recognition; Robustness; Shape; Statistical learning; Support vector machine classification; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Engineering and Electronic Commerce (IEEC), 2010 2nd International Symposium on
  • Conference_Location
    Ternopil
  • Print_ISBN
    978-1-4244-6972-7
  • Electronic_ISBN
    978-1-4244-6974-1
  • Type

    conf

  • DOI
    10.1109/IEEC.2010.5533272
  • Filename
    5533272