• DocumentCode
    3317922
  • Title

    Novel dry cleaning using trisilane with a new single-wafer reactor

  • Author

    Mieno, F. ; Miyata, H. ; Tsukune, A. ; Furumura, Y. ; Tsuchikawa, H.

  • Author_Institution
    Fujitsu Ltd., Tokyo, Japan
  • fYear
    1990
  • fDate
    9-12 Dec. 1990
  • Firstpage
    413
  • Lastpage
    416
  • Abstract
    A single-wafer reactor developed for low-temperature Si/sub 2/H/sub 6/ epitaxy (600 degrees C) and low-temperature Si/sub 3/H/sub 8//H/sub 2/ pretreatment (820 degrees C) is described. The major points covered are (1) the reactor´s heating system, which uses resistance heating with a SiC-coated graphite susceptor, and (2) the gas ejection system, which provides a high flow velocity and effectively introduces gas to the wafer. Using this reactor, 600 degrees C epitaxial growth was obtained with a 950 degrees C H/sub 2/ bake and growth at 700 AA/min. It was found that Si/sub 3/H/sub 8//H/sub 2/ treatment at 820 degrees C effectively removes oxygen and carbon before epitaxy. The reactor developed provides low-temperature epitaxy for silane without the need for special treatment with, for example, ultraviolet light or plasma.<>
  • Keywords
    elemental semiconductors; integrated circuit technology; semiconductor growth; semiconductor technology; silicon; surface treatment; vapour phase epitaxial growth; 600 degC; 820 degC; 950 degC; H/sub 2/; Si/sub 2/H/sub 6/; Si/sub 3/H/sub 8/; SiC-C; SiC-coated graphite susceptor; VPE; dry cleaning; epitaxial growth; gas ejection system; heating system; low-temperature Si/sub 2/H/sub 6/ epitaxy; low-temperature Si/sub 3/H/sub 8//H/sub 2/ pretreatment; resistance heating; semiconductors; silane; single-wafer reactor; trisilane; Cleaning; Epitaxial growth; Inductors; Plasmas; Resistance heating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1990.237144
  • Filename
    237144