Advanced semiconductor laser based electro-optical sampling system using soliton pulse compression for direct probing at 1.55-μm wavelength

Author

Reimann, O. ; Huhse, D. ; Dröge, E. ; Botcher, E.H. ; Bimberg, D. ; Stahlmann, H.-D.

Author_Institution

Inst. of Solid State Phys., Tech. Univ. Berlin, Germany

Volume

1

fYear

1998

fDate

1-4 Dec 1998

Firstpage

215

Abstract

We report on a compact, reliable and easy to use electro-optic sampling (EOS) system with high temporal resolution, and increased voltage sensitivity. With an operating wavelength of 1.55 μm and subpicosecond time jitter of the optical source, it is particularly suited for characterizing ultrafast long-wavelength photodetectors and receivers as well as electrically synchronized ultrahigh-speed devices and ICs

Keywords

laser reliability; measurement by laser beam; optical pulse compression; optical receivers; optical solitons; optical testing; photodetectors; semiconductor lasers; sensitivity; timing jitter; 1.55 mum; 1.55-μm wavelength; ICs; advanced semiconductor laser based electro-optical sampling system; direct probing; electrically synchronized ultrahigh-speed devices; high temporal resolution; increased voltage sensitivity; operating wavelength; optical receivers; optical source; soliton pulse compression; subpicosecond time jitter; ultrafast long-wavelength photodetectors; Earth Observing System; Jitter; Lasers and electrooptics; Optical devices; Optical receivers; Optical sensors; Sampling methods; Semiconductor lasers; Ultrafast optics; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE

Conference_Location

Orlando, FL

Print_ISBN

0-7803-4947-4

Type

conf

DOI

10.1109/LEOS.1998.737806

Filename

737806