• DocumentCode
    332401
  • Title

    Investigation of arc roots of constricted high current vacuum arcs

  • Author

    Haas, Wilfried ; Hartmann, Werner

  • Author_Institution
    Corp. Technol., Siemens AG, Erlangen, Germany
  • Volume
    1
  • fYear
    1998
  • fDate
    17-21 Aug 1998
  • Firstpage
    274
  • Abstract
    The anodic and cathodic arc roots of constricted high current vacuum arcs were investigated with a fast framing CCD camera of 1 μs exposure time. The experiments were performed on cup-shaped contacts, with sinusoidal currents of amplitudes of 20-100 kA and a halfwave duration of 11.5 ms. The arcs were drawn by contact separation, and accelerated by the Lorentz force between the arc current and the transverse magnetic field generated by the contrate contact. Both types of arc roots are elliptical, with a major to minor axis ratio of 1.4. The major axis points in the direction of arc propagation. Anodic and cathodic arc root cross-sectional areas as a function of current can both be described by a potential law with a common exponent of 0.76. For a current of 100 kA, mean current densities of 121 and 60 kA/cm2 were found in anode and cathode arc roots
  • Keywords
    anodes; cathodes; current density; insulation testing; magnetic fields; vacuum arcs; vacuum breakdown; vacuum insulation; 1 mus; 11.5 ms; 20 to 100 kA; Lorentz force; anodic arc roots; arc current; arc propagation; arc roots investigation; cathodic arc roots; constricted high-current vacuum arcs; contact separation; contrate contact; cross-sectional areas; cup-shaped contacts; exposure time; fast framing CCD camera; halfwave duration; mean current densities; potential law; sinusoidal currents; transverse magnetic field; Anodes; Cathodes; Charge coupled devices; Charge-coupled image sensors; Current density; Interrupters; Lorentz covariance; Magnetic fields; Vacuum arcs; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
  • Conference_Location
    Eindhoven
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-3953-3
  • Type

    conf

  • DOI
    10.1109/DEIV.1998.740624
  • Filename
    740624