Electron beam tester aided fault diagnosis for logic circuits based on sensitized paths

Author

Yanagida, Nobuhiro ; Takahashi, Hiroshi ; Takamatsu, Yuzo

Author_Institution

Kaminomoto Corp., Japan

fYear

1998

fDate

2-4 Dec 1998

Firstpage

237

Lastpage

241

Abstract

In this paper, we propose an electron beam tester (EB-tester) aided fault diagnosis for combinational and sequential circuits based on sensitized paths. For combinational circuits, we enhance the previous set of sensitizing input pairs and present EB-tester aided fault diagnosis. For sequential circuits, we introduce a measure for selecting internal lines to be probed and present EB-tester aided fault diagnosis. Experimental results of ISCAS´85 and ISCAS´89 benchmark circuits show the efficiency of the presented methods

Keywords

automatic testing; combinational circuits; electron beam testing; fault diagnosis; integrated circuit testing; large scale integration; logic testing; sequential circuits; ISCAS´85 benchmark circuits; ISCAS´89 benchmark circuits; combinational circuits; electron beam tester; fault diagnosis; internal lines; sensitized paths; sequential circuits; Circuit faults; Circuit testing; Combinational circuits; Computer science; Electron beams; Fault diagnosis; Large scale integration; Logic circuits; Logic testing; Sequential circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

ISSN

1081-7735

Print_ISBN

0-8186-8277-9

Type

conf

DOI

10.1109/ATS.1998.741619

Filename

741619