• DocumentCode
    3327045
  • Title

    An automatic test program generator

  • Author

    Ogata, Teruaki ; Ono, Tsunehiko ; Watanabe, Takao ; Ito, Kazuro

  • Author_Institution
    Mitsubishi Electric Co., Osaka, Japan
  • fYear
    1991
  • fDate
    28 Oct-1 Nov 1991
  • Firstpage
    1372
  • Abstract
    A test program generator that automatically generates test programs for LSI devices from general-purpose device test specifications is described. The AG-5 automatic test program generator consists of a hardware-independent front-end preprocessor that supports entry of device test specifications, a compiler to convert tester hardware and a reverse compiler to ensure that validated test parameter changes are reflected in the test specifications. The AG-5 program generation environment realizes large time savings by automatically generating programs in an easy-to-understand procedural language, and by ensuring that parameter changes in the test program are automatically reflected in the test specifications
  • Keywords
    automatic programming; automatic testing; integrated circuit testing; large scale integration; program compilers; AG-5; IC testing; LSI; automatic test program generator; compiler; reverse compiler; test specifications; Automatic programming; Automatic test pattern generation; Automatic testing; Circuit testing; Design engineering; Large scale integration; Microcomputers; Personnel; Program processors; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control and Instrumentation, 1991. Proceedings. IECON '91., 1991 International Conference on
  • Conference_Location
    Kobe
  • Print_ISBN
    0-87942-688-8
  • Type

    conf

  • DOI
    10.1109/IECON.1991.239068
  • Filename
    239068