• DocumentCode
    3327072
  • Title

    Hydrogen Sensitivity and Mechanism of Pd/V2O5 Thin Films

  • Author

    Haihu Yu ; Wu, Yinwei ; Li, Xiaofu ; Huang, Hua ; Shi, Yong ; Zhou, Lingde

  • Author_Institution
    Nat. Eng. Lab. for Fiber Opt. Sensing Technol., Wuhan Univ. of Technol., Wuhan, China
  • fYear
    2011
  • fDate
    16-18 May 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Abstract-Pd/V2O5 double layer films were deposited on glass substrates by magnetron sputtering. The hydrogen sensing properties of the films were analyzed using a UV-visible spectrophotometer. The surface morphology of the films was observed under a scanning electron microscope. Hydrogen sensing mechanism of the Pd/V2O5 films was researched on the basis of Raman spectra. The obtained Pd/V2O5 films are sensitive to hydrogen. A change of about 25% in relative transmittance at 560 nm can be observed when a Pd (30 nm)/V2O5 (280 nm) film was exposed to 4% hydrogen. No obvious defect can be observed after the films were exposed to hydrogen. For the magnetron sputtered Pd/V2O5 double layer films, the Pd layer mainly acts as a catalyst. The hydrogen molecules adsorbed on the Pd layer are dissociated into hydrogen atoms. When the hydrogen atoms diffuse into the inner V2O5 layers, V2O5 reacts with hydrogen, resulting the transformation of some V5+ into V4+ and the formation of vanadium bronze and as well as the change in the transmittance of the films.
  • Keywords
    Raman spectra; gas sensors; hydrogen; palladium; scanning electron microscopy; sputter deposition; surface morphology; thin films; ultraviolet spectra; vanadium compounds; visible spectra; H2; Pd; Pd-V2O5; Raman spectra; UV-visible spectrophotometer; catalyst; diffusion; dissociation; double layer films; glass substrates; hydrogen sensitivity; magnetron sputtering; scanning electron microscopy; surface morphology; thin films; transmittance; wavelength 560 nm; Atomic layer deposition; Magnetic films; Sensors; Sputtering; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics (SOPO), 2011 Symposium on
  • Conference_Location
    Wuhan
  • ISSN
    2156-8464
  • Print_ISBN
    978-1-4244-6555-2
  • Type

    conf

  • DOI
    10.1109/SOPO.2011.5780545
  • Filename
    5780545