• DocumentCode
    3327864
  • Title

    Degradation mechanism of low voltage cathodoluminescence of ZnS:Ag,Cl phosphors screen under the panel sealing process

  • Author

    Park, Zin-Min ; Jeon, Duk Young ; Cha, Seung Nam ; Jin, Yong Wan ; Kim, Jong Min

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Tech., Taejon, South Korea
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    197
  • Lastpage
    198
  • Abstract
    Degradation characteristics of low voltage cathodoluminescence (CL) of ZnS:Ag,Cl phosphor screen under the environment of panel sealing process was investigated. Auger electron spectroscopy (AES) and CL measurements showed that the compositional changes occur in the surface layer of phosphor screen
  • Keywords
    Auger electron spectra; cathodoluminescence; chlorine; fluorescent screens; phosphors; seals (stoppers); silver; surface composition; zinc compounds; Auger electron spectroscopy; ZnS:Ag,Cl; ZnS:Ag,Cl phosphor screen; degradation characteristics; low-voltage cathodoluminescence; panel sealing process; surface composition; Degradation; Displays; Electron beams; Heat treatment; Low voltage; Phosphors; Sealing materials; Spectroscopy; Surface treatment; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
  • Conference_Location
    Davis, CA
  • Print_ISBN
    0-7803-7197-6
  • Type

    conf

  • DOI
    10.1109/IVMC.2001.939721
  • Filename
    939721
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3327864