• DocumentCode
    3330353
  • Title

    Limited access testing of analog circuits: handling tolerances

  • Author

    Ahrikencheikh, Cherif ; Spears, Michael

  • Author_Institution
    Hewlett-Packard Co., Loveland, CO, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    577
  • Lastpage
    586
  • Abstract
    This paper deals with in-circuit testing of analog circuits that have limited access. A new method to account for tolerances on device values is presented, with results illustrating good performance in a production test environment
  • Keywords
    analogue integrated circuits; fault location; integrated circuit testing; linear programming; printed circuit testing; voltage measurement; admittance; analog circuits; component tolerance; handling tolerances; in-circuit testing; limited access testing; linear programming; production test; singular value decomposition; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Linear programming; Performance evaluation; Production; Singular value decomposition; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805782
  • Filename
    805782
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3330353