“Morphological” distribution of charge trapping sites in semicrystalline polymers

A simple technique for estimating “morphological” distribution of charge trapping sites in semicrystalline polymers are proposed. This technique is a combination of organic solvent vapor induced charge decay and the thermally stimulated current techniques and based on the fact that solvent molecules can penetrate only in amorphous parts of semicrystalline polymers. Applying this technique to poly-4-methylpenten-1 and polypropylene, we can correlate the charge trapping sites for a given TSC band with the higher order structure of these polymers