• DocumentCode
    3331397
  • Title

    Delay fault testing of IP-based designs via symbolic path modeling

  • Author

    Kim, Hyungwon ; Hayes, John P.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1045
  • Lastpage
    1054
  • Abstract
    Delay testing of designs that contain intellectual property (IF) cores is challenging. We propose a method that can test paths traversing both IP cores and user-defined blocks. It employs a highly efficient BDD-based path modeling method and an associated ATPG technique. Experimental results show that it robustly tests selected paths without using extra logic, and, at the same time, protects the intellectual property
  • Keywords
    VLSI; automatic test pattern generation; delays; fault diagnosis; industrial property; integrated circuit testing; logic testing; ATPG; IP-based design; SPMTEST; delay testing; intellectual property; symbolic path modeling; Automatic test pattern generation; Circuit faults; Circuit testing; Delay; Intellectual property; Logic circuits; Logic testing; Registers; Sociotechnical systems; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805838
  • Filename
    805838