DocumentCode
3331397
Title
Delay fault testing of IP-based designs via symbolic path modeling
Author
Kim, Hyungwon ; Hayes, John P.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear
1999
fDate
1999
Firstpage
1045
Lastpage
1054
Abstract
Delay testing of designs that contain intellectual property (IF) cores is challenging. We propose a method that can test paths traversing both IP cores and user-defined blocks. It employs a highly efficient BDD-based path modeling method and an associated ATPG technique. Experimental results show that it robustly tests selected paths without using extra logic, and, at the same time, protects the intellectual property
Keywords
VLSI; automatic test pattern generation; delays; fault diagnosis; industrial property; integrated circuit testing; logic testing; ATPG; IP-based design; SPMTEST; delay testing; intellectual property; symbolic path modeling; Automatic test pattern generation; Circuit faults; Circuit testing; Delay; Intellectual property; Logic circuits; Logic testing; Registers; Sociotechnical systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805838
Filename
805838
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