• DocumentCode
    3334007
  • Title

    Paraxial diode operation on rits-6

  • Author

    Hahn, K. ; Oliver, B.V. ; Webb, T.J. ; Welch, D.R. ; Schamiloglu, E.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2010
  • fDate
    20-24 June 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The paraxial diode is a relativistic electron-beam-driven diode that is being investigated as a potential x-ray source for flash radiography. The diode typically employs a gas-filled transport cell (~1 torr air) to focus the beam onto a high-atomic-number target to generate x-rays. Two key objectives are to produce a small x-ray spot size (<;5 mm) and high forward-directed dose (>600 Rads@1m). Ultimately, it appears the limitation in the diode is its large spot size (>5 mm). Previous particle-in-cell (PIC) simulations have shown that the primary limitation in spot size is due to beam sweep in which the finite decay of the plasma return current inside the gas cell causes the beam focal location to sweep axially away from the target during the timescale of the pulse. This leads to an increased time-integrated spot size [1]. Paraxial diode experiments have been performed on the RITS-6 pulsed power accelerator at Sandia National Laboratories at voltages 4.5-10.5 MV and with different rise-times 5-30 ns. Measurements of dose, dose rate, time-integrated (and time-resolved) spot size, and current are reported. These results are compared with the previous and newer models developed using the hybrid PIC/fluid code LSP [2]. Simulations consider temporal cathode emission evolution, anode ion emission, and kinetic and fluid gas-breakdown models for the range of operating parameters on RITS-6.
  • Keywords
    plasma production by laser; plasma simulation; RITS-6; anode ion emission; beam sweep; finite decay; flash radiography; gas cell; paraxial diode operation; particle-in-cell simulations; plasma return current; potential x-ray source; relativistic electron-beam-driven diode; temporal cathode emission evolution; Cathodes; Current measurement; Diodes; Laboratories; Particle beams; Plasma accelerators; Plasma simulation; Radiography; Size measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2010 Abstracts IEEE International Conference on
  • Conference_Location
    Norfolk, VA
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-5474-7
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2010.5534279
  • Filename
    5534279