• DocumentCode
    3334153
  • Title

    A test controller board for TSS

  • Author

    Kornegay, K.T. ; Brodersen, R.W.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1991
  • fDate
    1-2 Mar 1991
  • Firstpage
    38
  • Lastpage
    42
  • Abstract
    The design of a test controller board for a test support system is presented in this paper. Driven by the SCANTEST software, the test controller board exercises the boundary-scan and scan-path and built-in-self-test hardware implemented on the device under test via a dedicated test-bus. An analog test feature is also described
  • Keywords
    automatic test equipment; built-in self test; integrated circuit testing; logic testing; ATE; BIST; SCANTEST software; analog test feature; boundary-scan; built-in-self-test; dedicated test-bus; scan-path; test controller board; test support system; Automatic testing; Built-in self-test; Circuit testing; Control systems; Design for testability; Hardware; Process design; Sequential analysis; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 1991. Proceedings., First Great Lakes Symposium on
  • Conference_Location
    Kalamazoo, MI
  • Print_ISBN
    0-8186-2170-2
  • Type

    conf

  • DOI
    10.1109/GLSV.1991.143939
  • Filename
    143939
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3334153