DocumentCode
3334424
Title
Optical emission spectroscopy measurements of electron beam-generated plasma in argon, nitrogen and their mixtures
Author
Lock, Evgeniya H. ; Boris, David R. ; Walton, Scott G. ; Fernsler, Richard F. ; Singer, Irwin L.
Author_Institution
Plasma Phys. Div., Naval Res. Lab., Washington, DC, USA
fYear
2010
fDate
20-24 June 2010
Firstpage
1
Lastpage
1
Abstract
Summary form only given. The NRL electron beam-generated plasma source uses magnetically collimated sheet-like beam of high energy electrons to ionize the gas, providing control over critical plasma parameters including plasma density, ionization region, electron temperature, ion and radical fluxes. Perhaps, the most important advantages of the system are its inherently low electron temperature, typically below 1 eV, resulting in very low incident ion kinetic energies at adjacent surfaces, thereby providing unique opportunities in the processing of ion energy-sensitive materials, e.g. polymers and graphene. However, there remain many unresolved questions regarding the mechanisms of surface modifications induced by electron beam-generated plasmas, most notably, the influence of excited species. In this work, we apply optical emission spectroscopy in order to understand the spatial and temporal distribution of excited species in pure argon, nitrogen and their mixtures.
Keywords
argon; gas mixtures; nitrogen; plasma density; plasma diagnostics; plasma sources; plasma temperature; Ar; Ar-N2; N2; NRL electron beam-generated plasma source; critical plasma parameter; gas ionization; high energy electron; ion energy-sensitive materials; ion kinetic energy; ion temperature; low electron temperature; magnetically collimated sheet-like beam; optical emission spectroscopy; plasma density; spatial distribution; temporal distribution; Argon; Electron beams; Electron emission; Electron optics; Nitrogen; Plasma density; Plasma measurements; Plasma temperature; Spectroscopy; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2010 Abstracts IEEE International Conference on
Conference_Location
Norfolk, VA
ISSN
0730-9244
Print_ISBN
978-1-4244-5474-7
Electronic_ISBN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2010.5534305
Filename
5534305
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