• DocumentCode
    3334907
  • Title

    Exact and approximate analysis of ATM cell loss correlation

  • Author

    Tseng, Jih-Liang ; Meyer, John F.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1996
  • fDate
    4-6 Sep 1996
  • Firstpage
    120
  • Lastpage
    129
  • Abstract
    Cell loss behavior is analyzed for an ATM switch with homogeneous Markov sources. While prior work in this regard has focused mainly on measures such as the steady-state loss probability and conditional loss probability, we consider a more refined measure, namely the probability distribution of a cell loss period. Evaluation is based on a discrete-time, finite-state Markov process where cell arrivals at each input port are represented by an (M+1)-state source model (M ON states and one OFF state). Although we are able to formulate the loss period distribution exactly, for switches with realistic dimensions, the associated computational cost is high. As an alternative, we find that the loss period distribution is essentially insensitive to the buffer capacity K and, more importantly, its companion tail distribution can be accurately approximated by a relatively simple expression. As evidenced by numerical results, the errors of approximation are small and indeed, in many instances, the results obtained are effectively the same as those of an exact analysis
  • Keywords
    Markov processes; asynchronous transfer mode; performance evaluation; ATM cell loss correlation; cell loss correlation; computational cost; finite-state Markov process; homogeneous Markov sources; loss period distribution; Asynchronous transfer mode; Broadband communication; Computational efficiency; History; Loss measurement; Markov processes; Probability distribution; Steady-state; Switches; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Performance and Dependability Symposium, 1996., Proceedings of IEEE International
  • Conference_Location
    Urbana-Champaign, IL
  • ISSN
    1087-2191
  • Print_ISBN
    0-8186-7484-9
  • Type

    conf

  • DOI
    10.1109/IPDS.1996.540213
  • Filename
    540213