• DocumentCode
    3335982
  • Title

    Characterizing space vacuum contamination due to outgassing from dielectrics

  • Author

    Merryman, S.A. ; Little, J.C. ; Phillips, R.G. ; Gordon, L.B.

  • Author_Institution
    Space Power Inst., Auburn Univ., AL, USA
  • fYear
    1989
  • fDate
    9-12 Apr 1989
  • Firstpage
    1381
  • Abstract
    The effects of temperature and surface preparation on outgassing rates for different solid dielectric materials are presented. Among the parameters which influence the electrical breakdown strength of the vacuum region are gas pressure, species, and the length of exposure of the solid dielectrics to vacuum. Breakdown measurements have indicated that the outgassed products of the different materials behave similarly at equivalent pressures. This is due to the fact that the outgassed species (primarily atmospheric gases) are similar for the different materials. However, significant differences in breakdown voltages are observed when the outgassing rate for each material is used in determining the breakdown voltage as a function of time. It was also found that increasing the temperature from room temperature to 150°C caused an order of magnitude increase in the outgassing rate. In addition, the exposure of materials to wet (humid) air was found to increase their outgassing rates by almost an order of magnitude
  • Keywords
    dielectric materials; electric breakdown; electric strength; insulation; atmospheric gases; breakdown voltages; electrical breakdown strength; electrical insulation; humid air; outgassed species; outgassing rates; solid dielectric materials; space vacuum contamination; spacecraft electrical power systems; surface preparation; temperature; Atmospheric measurements; Dielectric breakdown; Dielectric materials; Dielectric measurements; Electric breakdown; Pollution measurement; Solids; Surface contamination; Temperature; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
  • Conference_Location
    Columbia, SC
  • Type

    conf

  • DOI
    10.1109/SECON.1989.132648
  • Filename
    132648