Optical and electrical characterization of silver nanoparticles in soda lime silicate glasses

Author

Berg, Klaus ; Capelletti, Rosanna ; Krajczyk, Ludwina ; Suszynska, Maria

Author_Institution

Phys. Fac., Martin-Luther-Univ., Halle-Wittenberg, Germany

fYear

1996

fDate

25-30 Sep 1996

Firstpage

378

Lastpage

383

Abstract

Optical absorption microspectrophotometry, thermally stimulated depolarization currents, and transmission electron microscopy were applied to characterize soda lime silicate glasses, in which Na was partially substituted by Ag, by means of an ion exchange process. The role of the exchange parameters (bath composition, time and temperature) and of annealing on the penetration depth and size-distribution of the silver nanoparticles was analysed. The TSDC spectra show up to three peaks in the range 200-450 K: the two main ones are in the ranges 280-290 K and 310-370 K, respectively. The latter is very sensitive to silver concentration, thermal annealing, and poling procedure and could be related to interfacial polarization effects

Keywords

annealing; calcium compounds; dielectric polarisation; dielectric relaxation; glass; glass structure; ion exchange; ion mobility; magnesium compounds; nanostructured materials; particle size; silver; sodium compounds; spectrophotometry; thermally stimulated currents; transmission electron microscopy; visible spectra; 200 to 450 K; Ag; Ag nanoparticles; Na₂O-CaO-MgO-SiO₂; Na₂O-CaO-MgO-SiO₂ glass; TSDC spectra; dielectric relaxation; electrical characterization; exchange parameters; glass microstructure; interfacial polarization effects; ion exchange process; ion mobility; optical absorption microspectrophotometry; optical characterization; particle size distribution; penetration depth; poling procedure; soda lime silicate glasses; thermal annealing; thermally stimulated depolarization currents; transmission electron microscopy; Absorption; Annealing; Electron optics; Nanoparticles; Optical microscopy; Optical sensors; Particle beam optics; Silver; Stimulated emission; Transmission electron microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 1996. (ISE 9), 9th International Symposium on

Conference_Location

Shanghai

Print_ISBN

0-7803-2695-4

Type

conf

DOI

10.1109/ISE.1996.578106

Filename

578106