DocumentCode
3338202
Title
Efficient modeling techniques for IR drop analysis in ASIC designs
Author
Cho, Dong-Soo ; Lee, Kyung-Ho ; Jang, Gi-Jeong ; Kim, Taek-Soo ; Kong, Jeong-Taek
Author_Institution
Semicond. R&D Center, Samsung Electron. Co. Ltd., South Korea
fYear
1999
fDate
1999
Firstpage
64
Lastpage
68
Abstract
In this paper, we propose efficient modeling techniques for analyzing power distribution in deep submicron (DSM) ASIC designs. VCCS (Voltage Controlled Current Source) and equivalent conductance modeling techniques are the key concepts in our approach, which provide the same analysis results as the original resistive network with two orders of magnitude speedup. In addition, soft-macro power consumption modeling is proposed to enable the analysis at the floorplan stage. Experimental results show that the power distribution analysis based on the proposed modeling techniques at the floorplan stage yields less than 5% error compared to the post-layout power analysis
Keywords
VLSI; application specific integrated circuits; circuit layout CAD; delays; integrated circuit layout; integrated circuit modelling; integrated circuit reliability; power supply circuits; ASIC designs; IR drop analysis; VCCS; deep submicron ASIC; equivalent conductance modeling techniques; floorplan stage; modeling techniques; power distribution; power distribution analysis; resistive network; soft-macro power consumption modeling; Application specific integrated circuits; Circuit simulation; Energy consumption; Performance analysis; Power distribution; Power supplies; Research and development; Switching frequency; Voltage; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC/SOC Conference, 1999. Proceedings. Twelfth Annual IEEE International
Conference_Location
Washington, DC
Print_ISBN
0-7803-5632-2
Type
conf
DOI
10.1109/ASIC.1999.806475
Filename
806475
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