DocumentCode
3339202
Title
Evaluation of temperature and humidity on PV module component degradation
Author
Kempe, M.D. ; Wohlgemuth, J.H.
Author_Institution
Nat. Renewable Energy Lab., Golden, CO, USA
fYear
2013
fDate
16-21 June 2013
Abstract
In use, photovoltaic modules are exposed to a wide range of environments and mounting conditions, each with a unique combination of temperature and humidity profiles. Here, we model the temperature and humidity environments of several representative climates and use this to estimate the amount of moisture entering a PV module. Then, we use this data to estimate the hydrolytic degradation of polyethylene terephthalate (PET) used in back-sheets. A very good understanding of the degradation kinetics exists for PET. Calculations using PET kinetics along with environmental data demonstrates that the damp heat test exposes PET to hydrolytic degradation equal to hundreds or even thousands of years. However, for less understood degradation modes, we demonstrate the range of relative degradation rates likely to exist as compared to the damp heat test. This more general analysis highlights the fact that within reasonable limits a single humidity can represent a given climate. Thus when a lower representative humidity is used, one can focus testing conditions on temperature effects. This can significantly simplify testing when very little is known about the humidity dependence of degradation processes.
Keywords
humidity; solar cells; temperature; PET kinetics; PV module component degradation; damp heat test; humidity dependence; humidity evaluation; hydrolytic degradation; photovoltaic modules; polyethylene terephthalate; temperature evaluation; Degradation; Heating; Humidity; Kinetic theory; Moisture; Positron emission tomography; Stress; Polyethylene terepthalate (PET); accelerated stress test; back-sheet; damp heat; encapsulation; humidity; modeling; moisture absorption; polymer; temperature; water permeation;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/PVSC.2013.6744112
Filename
6744112
Link To Document