• DocumentCode
    3340811
  • Title

    Characterization of Silicon-Film™ sheet material

  • Author

    Rand, James ; Rozgonyi, George ; Lu, Jinggang ; Reedy, Robert

  • Author_Institution
    AstroPower Inc., Newark, DE, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    98
  • Lastpage
    101
  • Abstract
    The Silicon-Film™ process produces a polycrystalline silicon sheet used in the production of solar cells. The process uses low-cost materials and high-throughput equipment for high volume production. This paper reports on the progress in characterizing this relatively new material. Small grain sizes and the presence of impurities are the logical explanation for performance losses in small grain polycrystalline silicon. With advances in the understanding of critical high temperature processes, such has gettering, views on impurity requirements have changed. As polycrystalline silicon sheet material can tolerate higher impurity levels then historically found in CZ grown materials, understanding the allowed impurity concentrations will lead to lower-cost silicon, which in turn will lead to lower-cost solar cells. Similarly, conventional grain size limits are shown to be inaccurate, allowing higher performance than thought possible from smaller grains. To delve into these and other specific material issues, an industry - academic - government team has been established. This paper reports on some of the results found by that team and highlights some of the conclusions that have been drawn as regards impurities and gettering.
  • Keywords
    elemental semiconductors; getters; grain size; semiconductor growth; silicon; solar cells; Si; Silicon-Film™ sheet material; critical high temperature processes; gettering; grain sizes; high volume production; high-throughput equipment; higher impurity levels; impurity requirements; low-cost materials; polycrystalline Si sheet; solar cells; Gettering; Government; Grain size; Impurities; Performance loss; Photovoltaic cells; Production; Sheet materials; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190465
  • Filename
    1190465