• DocumentCode
    3342378
  • Title

    Contact shadowing losses reduction by fine line screen printing

  • Author

    Butturi, M.A. ; Stefancich, M. ; Vincenzi, D. ; Martinelli, G. ; Pirozzi, L. ; Arabito, G. ; Izzi, M. ; Mangiapane, P.

  • Author_Institution
    INFM-Dipt. di Fisica, Universita di Ferrara, Italy
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    407
  • Lastpage
    409
  • Abstract
    Aim of this work is to transfer high efficiency concepts to large-scale crystalline silicon solar cell production, which is based on screen printing technology. The achievable cell efficiency obtainable by this technique is strongly affected by the limitation due to the contact shadowing losses necessary for reaching high Fill Factor values; indeed highest the FF, highest the surface coverage. An appealing way to overcome this limitation is to join screen printing to buried contact technology to get high aspect ratio grid pattern and, at the same time, a high FF value. Moreover this technology allows to easily define a selective emitter. Keeping to this purpose high resolution polymer screens or stencils with variable thickness have been tested. Both this steps have been obtained by adjusting the conventional screen printing process.
  • Keywords
    electrical contacts; elemental semiconductors; polymers; semiconductor device measurement; silicon; solar cells; thick films; Si; buried contact technology; cell efficiency; contact shadowing losses reduction; fill actor values; fine line screen printing; high aspect ratio grid pattern; high resolution polymer screens; large-scale crystalline silicon solar cell production; screen printing technology; Contact resistance; Costs; Crystallization; Metallization; Photovoltaic cells; Printing; Protection; Shadow mapping; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190545
  • Filename
    1190545