• DocumentCode
    3345209
  • Title

    Passive imaging exploiting multiple scattering using distributed apertures

  • Author

    Wang, Ling ; Son, Il-Young ; Yazici, Birsen

  • Author_Institution
    Coll. of Inf. Sci. & Technol., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    1385
  • Lastpage
    1388
  • Abstract
    We develop a new passive image formation method capable of exploiting information about multiple scattering in the environment using measurements from a sparse array of receivers that rely on illumination sources of opportunity. We use a physics-based approach to model wave propagation and develop a statistical model that relates measurements at a given receiver to measurements at other receivers. We formulate the imaging problem as a spatially resolved binary hypothesis testing problem using the model between the measurements at different receivers, statistics of the objects to be imaged and statistics of the additive noise and clutter. We address the spatially resolved hypothesis testing problem by constraining the associated discriminant functional to be linear and by maximizing the signal-to-noise-ratio of the test-statistic, and use the resulting spatially resolved test-statistics to form the image. We present numerical simulations to demonstrate the performance of the passive imaging algorithm.
  • Keywords
    clutter; electric field measurement; electromagnetic wave propagation; electromagnetic wave scattering; image reconstruction; numerical analysis; object detection; radio receivers; additive noise; binary hypothesis testing problem; clutter; distributed aperture; illumination source; multiple scattering; numerical simulation; passive image formation method; passive imaging; signal-to-noise-ratio; sparse receiver array; spatially resolved hypothesis testing problem; wave field measurement; wave propagation; Clutter; Imaging; Noise; Radar imaging; Receivers; Sonar navigation; Passive imaging; binary hypothesis testing; distributed apertures; multiple scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5652125
  • Filename
    5652125