• DocumentCode
    3347791
  • Title

    Investigation on the I-V characteristics of a high concentration, photovoltaic array

  • Author

    Vorster, F.J. ; van Dyk, E.E. ; Leitch, A.W.R.

  • Author_Institution
    Dept. of Math. Sci., Technikon, Port Elizabeth, South Africa
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    1604
  • Lastpage
    1607
  • Abstract
    The aim of this study was to highlight the effects on the I-V characteristics of concentrator arrays due to mismatch between series-connected high concentration PV modules and between single junction cells within a module. The mismatch between cells was caused by a number of factors including: misalignment of optical elements and cells, uneven shading due to dust or delamination of the cell-secondary lens interface, degradation of the main Fresnel lens and non-uniform cell material parameters. Small amounts of mismatch that would go unnoticed at one-Sun insolation levels are vastly amplified at high concentration ratios. This paper reports on, and interprets the regular I-V measurements that were recorded over a period of two years under various conditions. The effect of bypass diodes on the module I-V curves is also investigated. The general characteristics of the measured resultant I-V curves are explained. The degradation of the PV concentrator modules over a period of two years is also confirmed from the I-V measurements.
  • Keywords
    electric current measurement; lenses; solar cell arrays; solar energy concentrators; voltage measurement; Fresnel lens; cell module mismatch; concentrator photovoltaic arrays; current voltage characteristics; high concentration photovoltaic modules; misalignment; resistive heating effect; reverse biased strings; single junction cells; uneven shading; Africa; Current measurement; Degradation; Diodes; Lenses; Optical materials; Photovoltaic systems; Solar power generation; Stimulated emission; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190922
  • Filename
    1190922