DocumentCode
3347956
Title
Shear deformation of lead free solder joints
Author
Darveaux, Robert
Author_Institution
Amkor Technol., Inc., Chandler, AZ, USA
fYear
2005
fDate
31 May-3 June 2005
Firstpage
882
Abstract
The deformation behavior of lead free solder joints was characterized under shear loading. The test vehicle was a 0.5mm pitch wafer level chip scale package (WLCSP). Five alloys were compared: Sn63Pb37, Sn95.5Ag4.0Cu0.5, Sn96.5Ag3.0Cu0.5, Sn96.5Ag3.5, and Sn99.3Cu0.7. The strain rate range was between 1.0/sec and 10-7/sec, and test temperature was 25C. Both un-aged and thermally aged samples were tested. The aging condition was 24hrs at 125C. At strain rates of 10-2/sec and above, all of the alloys had comparable strength, except for Sn99.3Cu0.7, which had 20% to 30% lower strength. Sn63Pb37 was the most strain rate sensitive, and hence had the lowest strength below 10-4/sec strain rate. All alloys showed a 10% to 30% reduction in strength with aging. The solder joints exhibited very high ductility. In some cases strains of 100% were achieved before the joints started to fail. The ductility of Sn63Pb37 increased with aging, but the ductility of the lead free alloys all decreased with aging. Sn96.5Ag3.0Cu0.5 showed the largest decrease in ductility with aging. The steady state creep behavior observed in the current study is fairly consistent with other published work. However, the absolute value of the joint strength is a little higher than data on bulk samples. All of the alloys exhibited significant primary creep before steady state conditions were achieved. This behavior is not always reported in the literature, and hence it deserves more investigation.
Keywords
ageing; chip scale packaging; copper alloys; ductility; lead alloys; mechanical testing; reliability; shear deformation; silver alloys; solders; tin alloys; 0.55 mm; 125 C; 24 h; 25 C; SnAgCu; SnPb; aging condition; ductility; joint strength; lead free alloys; lead free solder joints; shear deformation; shear loading; steady state creep behavior; thermally aged samples; unaged samples; wafer level chip scale package; Aging; Capacitive sensors; Copper alloys; Creep; Environmentally friendly manufacturing techniques; Lead; Soldering; Steady-state; Testing; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2005. Proceedings. 55th
ISSN
0569-5503
Print_ISBN
0-7803-8907-7
Type
conf
DOI
10.1109/ECTC.2005.1441377
Filename
1441377
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