• DocumentCode
    3348708
  • Title

    Multi beam joined estimation for persistent scatterer interferometry

  • Author

    Adam, Nico ; Gernhardt, Stefan ; Eineder, Michael ; Bamler, Richard

  • Author_Institution
    German Aerosp. Center (DLR), Remote Sensing Technol. Inst., Wessling, Germany
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    4403
  • Lastpage
    4406
  • Abstract
    The persistent scatterer interferometry (PSI) is a powerful technique to monitor the line of sight (LOS) deformation with Millimeter accuracy in urban areas. Nowadays, this technique is well established for the sensors ERS and Envisat/ASAR. Nevertheless, the availability of high resolution SAR sensors enables new applications which require new estimation principles. Application test cases for the sensor TerraSAR-X were demonstrated already. However, the high resolution data are not really fully exploited at the moment. This paper describes a newly developed PSI estimation principle which improves the spatial resolution by the support of distributed scatterers and increases the temporal sampling by the joined estimation of different beams. The prototyped technique needs to cope with the different projections of the horizontal and vertical deformation components onto the line of sight (LOS). Basically, this allows the inversion of the beam´s observation equation and finally retrieves the vertical and horizontal deformation components.
  • Keywords
    radar interferometry; radar resolution; synthetic aperture radar; Envisat/ASAR; distributed scatterer; high resolution SAR sensors; line of sight deformation monitoring; multibeam joined estimation; persistent scatterer interferometry; sensor TerraSAR-X; sensors ERS; temporal sampling; Buildings; Estimation; Interferometry; Monitoring; Sensors; Spatial resolution; Time series analysis; PSI; Persistent Scatterer Interferometry; TerraSAR-X InSAR application demonstration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5652349
  • Filename
    5652349