• DocumentCode
    3349218
  • Title

    Extended Fault Analysis on Elliptic Curve Cryptosystems against Repeated Doubling

  • Author

    Yingzhan, Kou ; Jinzhong, Zhang ; Bo, Wan ; Ping, Zhou

  • Author_Institution
    Dept. of Comput. Eng., Ordnance Eng. Coll., Shijiazhuang, China
  • fYear
    2011
  • fDate
    21-23 Oct. 2011
  • Firstpage
    545
  • Lastpage
    548
  • Abstract
    This paper constitutes a fault model on elliptic curve cryptosystems against repeated doubling based on the principle of sign change fault attacks, and presents an improved fault analysis method which can effectively solve the "zero block failure" problem. We attack the elliptic curve cryptosystems with binary method, fixed window method, and also sliding window method in this way. The simulation experiments demonstrate: 15-16 times fault injections are enough to recover full 192-bits key. Because of having similar repeated doubling, the method presented here can provide some ideas for fault attack on other public key cryptosystems.
  • Keywords
    failure analysis; public key cryptography; binary method; elliptic curve cryptosystems; extended fault analysis method; fixed window method; public key cryptosystems; repeated doubling; sign change fault attacks; sliding window method; zero block failure problem; Algorithm design and analysis; Computational efficiency; Elliptic curve cryptography; Elliptic curves; elliptic curve cryptosystems; fault attacks; public key cryptography; repeated doubling; zero block failure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-0-7695-4519-6
  • Type

    conf

  • DOI
    10.1109/IMCCC.2011.141
  • Filename
    6154166