DocumentCode
3349218
Title
Extended Fault Analysis on Elliptic Curve Cryptosystems against Repeated Doubling
Author
Yingzhan, Kou ; Jinzhong, Zhang ; Bo, Wan ; Ping, Zhou
Author_Institution
Dept. of Comput. Eng., Ordnance Eng. Coll., Shijiazhuang, China
fYear
2011
fDate
21-23 Oct. 2011
Firstpage
545
Lastpage
548
Abstract
This paper constitutes a fault model on elliptic curve cryptosystems against repeated doubling based on the principle of sign change fault attacks, and presents an improved fault analysis method which can effectively solve the "zero block failure" problem. We attack the elliptic curve cryptosystems with binary method, fixed window method, and also sliding window method in this way. The simulation experiments demonstrate: 15-16 times fault injections are enough to recover full 192-bits key. Because of having similar repeated doubling, the method presented here can provide some ideas for fault attack on other public key cryptosystems.
Keywords
failure analysis; public key cryptography; binary method; elliptic curve cryptosystems; extended fault analysis method; fixed window method; public key cryptosystems; repeated doubling; sign change fault attacks; sliding window method; zero block failure problem; Algorithm design and analysis; Computational efficiency; Elliptic curve cryptography; Elliptic curves; elliptic curve cryptosystems; fault attacks; public key cryptography; repeated doubling; zero block failure;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on
Conference_Location
Beijing
Print_ISBN
978-0-7695-4519-6
Type
conf
DOI
10.1109/IMCCC.2011.141
Filename
6154166
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