DocumentCode
3350215
Title
Stimulus generation using the test pattern development language
Author
Manley, Mary ; Puffer, David ; Perrey, Karl
Author_Institution
Intel Corp., Chandler, AZ, USA
fYear
1991
fDate
23-27 Sep 1991
Lastpage
38078
Abstract
Stimulus generation is one of the more challenging tasks in IC design. The Test Pattern Development Language (TPDL) simplifies this process by guaranteeing that simulation patterns are correctly constructed for direct use by the tester. TPDL provides a generic interface which can be used on multiple platforms. The creation of complex stimuli is facilitated via the high level language constructs contained within TPDL
Keywords
CMOS integrated circuits; VLSI; application specific integrated circuits; circuit layout CAD; formal specification; formal verification; integrated circuit testing; microprocessor chips; CMOS; IC design; TPDL; creation of complex stimuli; generic interface; high level language constructs; microprocessors; multiple platforms; stimulus generation; test pattern development language; Algorithms; Design engineering; High level languages; Maintenance engineering; Standards development; Test pattern generators; Testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location
Rochester, NY
Print_ISBN
0-7803-0101-3
Type
conf
DOI
10.1109/ASIC.1991.242887
Filename
242887
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