DocumentCode
3351004
Title
Radiation and life test procedures for military and aerospace ASIC components
Author
Chrusciel, Richard W.
Author_Institution
ETEC Inc., West Peabody, MA, USA
fYear
1991
fDate
23-27 Sep 1991
Lastpage
38108
Abstract
Presents part qualification, characterization and test/screening procedures for ASICs, intended for military and aerospace use. These procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems
Keywords
aerospace instrumentation; application specific integrated circuits; environmental testing; inspection; integrated circuit testing; life testing; military equipment; radiation hardening (electronics); ASIC testing; aerospace ASIC components; burn-in; characterization; commercial technology; life test procedures; low cost evaluation; military ASIC components; part qualification; radiation test procedures; screening procedures; Aerospace testing; Application specific integrated circuits; Costs; Life testing; Logic; Production systems; Prototypes; Qualifications; Silicon; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location
Rochester, NY
Print_ISBN
0-7803-0101-3
Type
conf
DOI
10.1109/ASIC.1991.242942
Filename
242942
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