• DocumentCode
    3351004
  • Title

    Radiation and life test procedures for military and aerospace ASIC components

  • Author

    Chrusciel, Richard W.

  • Author_Institution
    ETEC Inc., West Peabody, MA, USA
  • fYear
    1991
  • fDate
    23-27 Sep 1991
  • Lastpage
    38108
  • Abstract
    Presents part qualification, characterization and test/screening procedures for ASICs, intended for military and aerospace use. These procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems
  • Keywords
    aerospace instrumentation; application specific integrated circuits; environmental testing; inspection; integrated circuit testing; life testing; military equipment; radiation hardening (electronics); ASIC testing; aerospace ASIC components; burn-in; characterization; commercial technology; life test procedures; low cost evaluation; military ASIC components; part qualification; radiation test procedures; screening procedures; Aerospace testing; Application specific integrated circuits; Costs; Life testing; Logic; Production systems; Prototypes; Qualifications; Silicon; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
  • Conference_Location
    Rochester, NY
  • Print_ISBN
    0-7803-0101-3
  • Type

    conf

  • DOI
    10.1109/ASIC.1991.242942
  • Filename
    242942