• DocumentCode
    3354398
  • Title

    SI-thyristor as a high power switching device for fast high voltage pulse generators

  • Author

    Ibuka, Shinji ; Saito, Kazunari ; Yamamoto, Akira ; Hamibuchi, K. ; Yasuoka, Koichi ; Ishii, Shozo ; Shimizu, Naohiro

  • Author_Institution
    Tokyo Inst. of Technol., Japan
  • Volume
    2
  • fYear
    1997
  • fDate
    June 29 1997-July 2 1997
  • Firstpage
    954
  • Abstract
    Characterization of SI-thyristors as a fast closing switch for pulsed power application was examined. Since the SI-thyristors employed in this study are normally on-state, a negative bias voltage is necessary at the gate electrode to establish hold-off-state. As a consequence, fast current rise rate can be strongly expected. A low impedance gate driving circuit built with MOSFETs improved turn-on characteristics. By adjusting anode voltage distribution and gate timing, carefully stacked SI-thyristors were successfully operated to make turn on. The highest di/dt obtained in this study is 55 kA//spl mu/s. A fast high voltage pulse generator with magnetic pulse compression scheme was built by using stacked SI-thyristors. To obtain a faster high voltage pulse a nonlinear transmission line as an additional circuit for pulse sharpening was employed.
  • Keywords
    driver circuits; power MOSFET; pulse generators; pulsed power switches; thyristor applications; MOSFET; SI-thyristor; anode voltage distribution; fast closing switch; fast current rise rate; fast high voltage pulse generators; gate electrode; gate timing; high power switching device; hold-off-state; low impedance gate driving circuit; magnetic pulse compression scheme; negative bias voltage; nonlinear transmission line; pulse sharpening; pulsed power application; Anodes; Electrodes; Impedance; MOSFETs; Pulse circuits; Pulse compression methods; Pulse generation; Switches; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
  • Conference_Location
    Baltimore, MA, USA
  • Print_ISBN
    0-7803-4213-5
  • Type

    conf

  • DOI
    10.1109/PPC.1997.674516
  • Filename
    674516