• DocumentCode
    3354557
  • Title

    Stitching orders in patch-and-stitch localization algorithms for wireless sensor networks

  • Author

    Kwon, Oh-Heum ; Song, Ha-Joo

  • Author_Institution
    Div. of Electron., Comput. & Telecommun. Eng., Pukyong Nat. Univ., Busan
  • fYear
    2008
  • fDate
    27-27 March 2008
  • Firstpage
    233
  • Lastpage
    241
  • Abstract
    In localization algorithms following the "patch-and-stitch" strategy, the network is divided into small overlapping subregions. For each subregion, the algorithm builds a local structure called a patch which is actually an embedding of the nodes it spans in a relative coordinate system. Then, the patches are stitched together to form a single global map. In this class of algorithms, the stitching order makes a great influence on the performance of the algorithm. In this paper, we present a formal framework to deal with stitching orders. In our framework, each stitching scheme consists of a stitching policy and a potential function. The potential function is to predict how well a patch will be stitched if patches are stitched according to a given partial order. The stitching policy is a mechanism that determines the stitching order based on the predictions by the potential function. We present various stitching schemes and evaluate their performances though simulations.
  • Keywords
    mobility management (mobile radio); wireless sensor networks; node embedding; patch-and-stitch localization algorithms; wireless sensor networks; Computer networks; Costs; Distributed algorithms; Energy consumption; Global Positioning System; Navigation; Performance evaluation; Robustness; Telecommunication computing; Wireless sensor networks; distributed algorithms; localization algorithm; patch and stitch; wireless sensor network;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Positioning, Navigation and Communication, 2008. WPNC 2008. 5th Workshop on
  • Conference_Location
    Hannover
  • Print_ISBN
    978-1-4244-1798-8
  • Electronic_ISBN
    978-1-4244-1799-5
  • Type

    conf

  • DOI
    10.1109/WPNC.2008.4510380
  • Filename
    4510380