Multiple signature analysis: a framework for built-in self-diagnostic

Author

Karpovsky, M.G. ; Chaudhry, S.M. ; Levitin, L.B.

Author_Institution

Dept. of Electr. Comput. & Syst. Eng., Boston Univ., MA, USA

fYear

1992

fDate

8-10 July 1992

Firstpage

112

Lastpage

119

Abstract

A framework, based on nonbinary multiple error correcting codes, for built-in self-diagnostics is presented. Novel space-time compressors are proposed for test response compression and fault diagnosis. Fault-detecting and locating capabilities for space-time compressors are analyzed in the case when nonbinary Reed-Solomon codes are used. Fault-masking and diagnosis probabilities for the chip-independent error model are estimated. For this error-model, the fault-masking probabilities are analyzed using the weight distributions of Reed-Solomon codes.<>

Keywords

Reed-Solomon codes; built-in self test; error correction codes; fault location; logic testing; built-in self-diagnostic; chip-independent error model; fault detection; fault diagnosis; fault location; fault masking; framework; multiple signature analysis; nonbinary Reed-Solomon codes; nonbinary multiple error correcting codes; space-time compressors; test response compression; weight distributions; Automatic testing; Built-in self-test; Circuit faults; Compressors; Electrical fault detection; Error correction codes; Fault detection; Fault diagnosis; Laboratories; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on

Conference_Location

Boston, MA, USA

Print_ISBN

0-8186-2875-8

Type

conf

DOI

10.1109/FTCS.1992.243609

Filename

243609