DocumentCode
3356175
Title
Registration study of great resolution difference remote sensing image based on invariant feature
Author
Jiang Tao ; Ni Xiliang ; Fang Lei ; Liu Guolin ; Ji Min ; Sun Lin
Author_Institution
Remote Sensing Dept., Shandong Univ. of Sci. & Technol., Qingdao, China
fYear
2010
fDate
25-30 July 2010
Firstpage
995
Lastpage
998
Abstract
The registration of high resolution panchromatic image and the low resolution multi-spectrum image plays a growing vital role in the remote sensing applications. Aiming at this problem, during this paper, a locally adaptive registration algorithm of the remote sensing image based on SIFT is proposed. The algorithm can keep matching points uniformly distributed. First, obtain SIFT points feature descriptors from base image and warp image by cutting up them, which realizes the uniform distribution of feature points and also speeds up the extraction rate of SIFT feature points. Then, select the best block matching points adaptively using geometric constraint to improve the image matching accuracy. Finally, some mismatched points are eliminated by using consistency checking, which further improved matching accuracy. Numerous experiments have been conducted for different type images. The experimental results show that the improved algorithm can realize registration of great solution difference images effectively and accurately.
Keywords
feature extraction; image matching; image registration; image resolution; remote sensing; adaptive registration algorithm; block matching points; feature extraction; geometric constraint; high resolution panchromatic image registration; low resolution multispectrum image matching; remote sensing SIFT; remote sensing image resolution; warp image; Accuracy; Algorithm design and analysis; Complexity theory; Feature extraction; Image registration; Image resolution; Remote sensing; Geometric Constraint; Geometric Registration; Image Matching; Invariant Feature; Locally adaptive;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location
Honolulu, HI
ISSN
2153-6996
Print_ISBN
978-1-4244-9565-8
Electronic_ISBN
2153-6996
Type
conf
DOI
10.1109/IGARSS.2010.5652853
Filename
5652853
Link To Document