DocumentCode
3356630
Title
Characterization Of Semiconductor Surfaces And Interfaces By Non-linear Spectroscopy
Author
Heinz, T.F.
Author_Institution
T. J. Watson Research Center
fYear
1990
fDate
4-9 Nov 1990
Firstpage
602
Lastpage
602
Keywords
Atom optics; Atomic layer deposition; Atomic measurements; Nonlinear optics; Optical films; Optical harmonic generation; Optical materials; Optical sensors; Probes; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN
0-87942-550-4
Type
conf
DOI
10.1109/LEOS.1990.690693
Filename
690693
Link To Document