A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process

An efficient crosstalk delay degradation measurement method with a 65 nm process is proposed. The voltage drop impact on the crosstalk delay is measured. The test module incorporates filters which omit glitches high speed complicated circuits unintentionally create. The module consists of standard cells only, that makes designing very easy. An intensive comparison of measured results with simulations for 64 times 216 patterns of six aggressor activations (timing and combinations) shows precise matching with less than 10% errors.