• DocumentCode
    3359556
  • Title

    Test Structure and Testing of the Microsoft XBOX 360/sup TM/ Processor High Speed Front Side Bus

  • Author

    Pham, Tung ; Koehler, Brian ; Young, Daniel ; Bushard, Louis

  • Author_Institution
    IBM Syst. & Technol. Group Dev., Austin, TX
  • fYear
    2006
  • fDate
    22-27 Oct. 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The microsoft XBOX 360/sup TM/ processor is a complex design with many multi-gigahertz, synchronous and asynchronous clock domains. One of the key design features is the high speed front side bus I/O system that consists of analog and digital elements that provide an interesting manufacturing test challenge for a low test cost, high volume, and high quality chip level application. This publication focuses on the test solution for the high speed custom logic that aligns the source synchronous clock to the associated receiver data
  • Keywords
    clocks; field buses; logic testing; microprocessor chips; system-on-chip; analog elements; asynchronous clock domains; digital elements; high speed custom logic; high speed front side bus I/O system; microsoft XBOX 360 processor; synchronous clock domains; Circuit testing; Clocks; Graphics; Logic testing; Phase locked loops; Physical layer; Protocols; System testing; System-on-a-chip; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0291-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297639
  • Filename
    4079317